RF and Wireless Measurements
This topic explains essential RF measurements that must be made on modern wireless communications equipment. The newest models of the necessary RF test equipment are explained and demonstrated, including vector network analyzers, spectrum analyzers, digitally modulated signal generators and vector signal analyzers.
| 135 | RF Measurements:Principles & Demonstration This 5-day lecture-based course explains essential RF measurements that must be made on modern wireless communications equipment - cellular, PCS and 3G phones, wireless LANs, GPS navigation systems, and DBS TV. The newest models of the necessary RF test equipment will be explained and demonstrated, including vector network analyzers, spectrum analyzers, digitally modulated signal generators and vector signal analyzers. Significant class time is dedicated to demonstrations. Includes a review of basic RF and wireless fundamentals. Course 135-4347:Mar 21-Mar 25, 2011: San Jose, CA Presented by Al Scott and Rex Frobenius Register by 2/14/2011 and pay $2195, otherwise pay $2395 |
| 166 | Production Testing of RF and SOC Devices for Wireless Communications A merger of RF and mixed-signal test is upon us with the increasing number of integrated wireless devices being developed with System-On-a-Chip (SOC) technology. Test engineering is becoming an engineering class unto itself. It no longer suffices to be an RF test engineer, or mixed signal engineer or digital engineer. A new breed of engineer, the SOC test engineer, is becoming a necessity. This highly sought after skill set is what is demanded by wireless chip manufactures (Bluetooth, WLAN, 2G, 2.5G, 3G, UWB). This course is the first of its kind to help train the already talented test engineers with the necessary SOC skill sets required for the next generation devices. Course 166-4317:Dec 06-Dec 10, 2010: San Jose, CA Presented by Keith Schaub Register by 11/1/2010 and pay $1995, otherwise pay $2195 |
| 186 | RF Fundamentals, Modeling and De-Embedding Techniques This course is a good follow-on course to #135, offering greater understanding of the Smith Chart and S-parameters and then moving on to device modeling and de-embedding on the last day. This course could be a good alternative to the five-day Applied RF Techniques I (#001) course for people who are only concerned with measurements. |
| 031 | RF Transceiver Architecture, Design and Evaluation This five day course covers system-level concepts for RF & wireless systems. The last day covers the testing and troubleshooting that can be performed at the system level. Course 031-4318:Dec 06-Dec 10, 2010: San Jose, CA Presented by Ed Niehenke Register by 11/1/2010 and pay $1995, otherwise pay $2195 |
| 112 | Wireless Circuits, Systems and Test Fundamentals A combination of three popular topics in one course, this five day course features material covering linear circuit design, system level design, and measurements. Please check the course outline for the last day to see measurement topics covered. |
| 161 | Applied Design of RF/Wireless Products and Systems This course discusses measurements in the context of designing a product that uses digital modulation. Approximately one day is spent on the subject of measurements. Please review the course outline, day two. Course 161-4338:Feb 28-Mar 02, 2011: San Diego, CA Presented by Chris Potter Register by 1/24/2011 and pay $1395, otherwise pay $1495 |
| 069 | Balanced Circuits for Wireless Applications This industry-unique one-day short course demonstrates how to use mixed-mode and four-port s-parameters to characterize balanced and differential circuits, CMRR, crosstalk, and mode conversions at RF/microwave frequencies. S-parameter theory and test equipment revolutionized RF/MW circuit design and measurements three decades ago. However, only recent technology has enabled the direct measurement and application of s-parameters to balanced analog/IF/RF/microwave circuits and systems. |
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Test and Measurement
Engineers & Technicians "New to RF" - Recommendations
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